skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Pulse-length dependence of absorptance and degradation rate of fused silica at 248 nm

Conference ·
OSTI ID:552254
;  [1];  [2]
  1. Laser-Laboratorium Goettingen e.V. (Germany)
  2. Heraeus Quarzglas GmbH, Hanau (Germany)

Optical components for industrial excimer laser applications such as semiconductor lithography steppers have to withstand more than 10{sup 10} laser pulses without suffering from significant cumulative absorption increase due to color center formation. Lithography lasers are now approaching pulse durations of 10 ns and repetition rates of 1000 Hz, a domain unexplored in previous degradation studies. With the aid of an optical pulse-extension unit and a modified laser resonator, we measured absorptance and absorption changes in Suprasil 312 UV-grade fused silica calorimetrically at pulse lengths of 7 - 73 ns. At 100 mJ/cm{sup 2}, no degradation was detectable even after 500 000 pulses, but there was slight evidence of an absorption decrease due to laser cleaning. At 400 mJ/cm{sup 2}, both absorptance and degradation rate increased towards shorter pulses and hence higher intensities, but even over the full pulse-length range, the changes remained moderate. Furthermore, degradation at 300 Hz was lower than at 150 Hz, indicating that a simultaneous bleaching effect might be involved which favors future high-repetition rate applications.

Research Organization:
International Society for Optical Engineering, Washington, DC (United States)
OSTI ID:
552254
Report Number(s):
CONF-961070-Vol.2966; TRN: 98:009063
Resource Relation:
Conference: 28. annual symposium on optical materials for high power lasers - Boulder damage symposium, Boulder, CO (United States), 7-9 Oct 1996; Other Information: PBD: [1997]; Related Information: Is Part Of Laser-induced damage in optical materials: 1996. Twenty-eighth annual Boulder damage symposium, proceedings; Bennett, H.E.; Guenther, A.H.; Kozlowski, M.R.; Newnam, B.E.; Soileau, M.J. [eds.]; PB: 686 p.
Country of Publication:
United States
Language:
English