Improved substrate structures for InP-based devices
A substrate structure for an InP-based semiconductor device having an InP-based film is disclosed. The substrate structure includes a substrate region having a light-weight bulk substrate and an upper GaAs layer. An interconnecting region is disposed between the substrate region and the InP-based device. The interconnecting region includes a compositionally graded intermediate layer substantially lattice matched at its one end to the GaAs layer and substantially lattice matched at its opposite end to the InP-based film. The interconnecting region further includes a dislocation mechanism disposed between the GaAs layer and the InP-based film in cooperation with the graded intermediate layer, the buffer mechanism blocking and inhibiting propagation of threading dislocations between the substrate region and the InP-based device. 1 fig.
- Research Organization:
- Solar Energy Research Inst., Golden, CO (United States)
- Sponsoring Organization:
- USDOE; USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC02-83CH10093
- Assignee:
- Dept. of Energy
- Patent Number(s):
- PATENTS-US-A7251484
- Application Number:
- ON: DE91017349; PPN: US 7-251484
- OSTI ID:
- 5480625
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
SEMICONDUCTOR DEVICES
FABRICATION
SUBSTRATES
DESIGN
COST
GALLIUM ARSENIDES
INDIUM PHOSPHIDES
INVENTIONS
LAYERS
ARSENIC COMPOUNDS
ARSENIDES
GALLIUM COMPOUNDS
INDIUM COMPOUNDS
PHOSPHIDES
PHOSPHORUS COMPOUNDS
PNICTIDES
360601* - Other Materials- Preparation & Manufacture
426000 - Engineering- Components
Electron Devices & Circuits- (1990-)