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Title: Coherent hard x-ray focusing optics and applications

Conference ·
OSTI ID:5473872

Coherent hard x-ray beams with a flux exceeding 10{sup 9} photons/second with a bandwidth of 0.1% will be provided by the undulator at the third generation synchrotron radiation sources such as APS, ESRF, and Spring-8. The availability of such high flux coherent x-ray beams offers excellent opportunities for extending the coherence-based techniques developed in the visible and soft x-ray part of the electromagnetic spectrum to the hard x-rays. These x-ray techniques (e.g., diffraction limited microfocusing, holography, interferometry, phase contrast imaging and signal enhancement), may offer substantial advantages over non-coherence-based x-ray techniques currently used. For example, the signal enhancement technique may be used to enhance an anomalous x-ray or magnetic x-ray scattering signal by several orders of magnitude. Coherent x-rays can be focused to a very small (diffraction-limited) spot size, thus allowing high spatial resolution microprobes to be constructed. The paper will discuss the feasibility of the extension of some coherence-based techniques to the hard x-ray range and the significant progress that has been made in the development of diffraction-limited focusing optics. Specific experimental results for a transmission Fresnel phase zone plate that can focus 8.2 keV x-rays to a spot size of about 2 microns will be briefly discussed. The comparison of measured focusing efficiency of the zone plate with that calculated will be made. Some specific applications of zone plates as coherent x-ray optics will be discussed. 17 refs., 4 figs.

Research Organization:
Argonne National Lab., IL (United States)
Sponsoring Organization:
USDOE; USDOE, Washington, DC (United States)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
5473872
Report Number(s):
ANL/CP-72553; CONF-9107115-41; ON: DE91017968
Resource Relation:
Conference: Society of Photo-Optical Instrumentation Engineers (SPIE) meeting, San Diego, CA (United States), 21-26 Jul 1991
Country of Publication:
United States
Language:
English