Process for measuring degradation of sulfur hexafluoride in high voltage systems
This invention is a method of detecting the presence of toxic and corrosive by-products in high voltage systems produced by electrically induced degradation of SF/sub 6/ insulating gas in the presence of certain impurities. It is an improvement over previous methods because it is extremely sensitive, detecting by-products present in parts per billion concentrations, and because the device employed is of a simple design and takes advantage of the by-products natural affinity for fluoride ions. The method employs an ion-molecule reaction cell in which negative ions of the by-products are produced by fluorine attachment. These ions are admitted to a negative ion mass spectrometer and identified by their spectra. This spectrometry technique is an improvement over conventional techniques because the negative ion peaks are strong and not obscured by a major ion spectra of the SF/sub 6/ component as is the case in positive ion mass spectrometry.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- DOE Contract Number:
- AC05-84OR21400
- Assignee:
- Dept. of Energy
- Application Number:
- ON: DE86013808
- OSTI ID:
- 5455493
- Country of Publication:
- United States
- Language:
- English
Similar Records
Process for measuring degradation of sulfur hexafluoride in high voltage systems
SULFUR HEXAFLUORIDE TREATMENT OF USED NUCLEAR FUEL TO ENHANCE SEPARATIONS
Related Subjects
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
CHEMICAL ANALYSIS
MASS SPECTROSCOPY
MASS SPECTROMETERS
SULFUR FLUORIDES
DECOMPOSITION
CHEMICAL REACTIONS
FLUORIDES
FLUORINE COMPOUNDS
HALIDES
HALOGEN COMPOUNDS
MEASURING INSTRUMENTS
SPECTROMETERS
SPECTROSCOPY
SULFUR COMPOUNDS
440300* - Miscellaneous Instruments- (-1989)
400104 - Spectral Procedures- (-1987)