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Title: Surface and bulk electronic structure of thin-film wurtzite GaN

Abstract

The bulk and surface valence-band electronic structure of thin-wurtzite GaN has been studied using angle-resolved photoemission spectroscopy. The bulk band dispersion along the {Gamma}{Delta}A, {Gamma}{Sigma}M, and {Gamma}TK directions of the bulk Brillouin zone was measured. Our results indicate the local-density approximation band-structure calculations using partial-core corrections for the Ga 3d states predict the relative dispersion of many of the observed bands with a high degree of accuracy. Furthermore, a nondispersive feature was identified near the valence-band maximum in a region of k space devoid of bulk states. This feature is identified as emission from a surface state on GaN(0001)-(1{times}1). The symmetry of this surface state is even with respect to the mirror planes of the surface and polarization measurements indicate that it is of sp{sub z} character, consistent with a dangling-bond state. {copyright} {ital 1997} {ital The American Physical Society}

Authors:
; ;  [1]; ; ;  [2]
  1. Department of Physics, Boston University, Boston, Massachusetts 02215 (United States)
  2. Department of Electrical and Computer Engineering, Boston University, Boston, Massachusetts 02215 (United States)
Publication Date:
OSTI Identifier:
543828
Resource Type:
Journal Article
Journal Name:
Physical Review, B: Condensed Matter
Additional Journal Information:
Journal Volume: 56; Journal Issue: 16; Other Information: PBD: Oct 1997
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; GALLIUM NITRIDES; ELECTRONIC STRUCTURE; THIN FILMS; PHOTOELECTRON SPECTROSCOPY; BRILLOUIN ZONES; CHEMICAL BONDS; BAND THEORY; ENERGY GAP

Citation Formats

Dhesi, S S, Stagarescu, C B, Smith, K E, Doppalapudi, D, Singh, R, and Moustakas, T D. Surface and bulk electronic structure of thin-film wurtzite GaN. United States: N. p., 1997. Web. doi:10.1103/PhysRevB.56.10271.
Dhesi, S S, Stagarescu, C B, Smith, K E, Doppalapudi, D, Singh, R, & Moustakas, T D. Surface and bulk electronic structure of thin-film wurtzite GaN. United States. https://doi.org/10.1103/PhysRevB.56.10271
Dhesi, S S, Stagarescu, C B, Smith, K E, Doppalapudi, D, Singh, R, and Moustakas, T D. 1997. "Surface and bulk electronic structure of thin-film wurtzite GaN". United States. https://doi.org/10.1103/PhysRevB.56.10271.
@article{osti_543828,
title = {Surface and bulk electronic structure of thin-film wurtzite GaN},
author = {Dhesi, S S and Stagarescu, C B and Smith, K E and Doppalapudi, D and Singh, R and Moustakas, T D},
abstractNote = {The bulk and surface valence-band electronic structure of thin-wurtzite GaN has been studied using angle-resolved photoemission spectroscopy. The bulk band dispersion along the {Gamma}{Delta}A, {Gamma}{Sigma}M, and {Gamma}TK directions of the bulk Brillouin zone was measured. Our results indicate the local-density approximation band-structure calculations using partial-core corrections for the Ga 3d states predict the relative dispersion of many of the observed bands with a high degree of accuracy. Furthermore, a nondispersive feature was identified near the valence-band maximum in a region of k space devoid of bulk states. This feature is identified as emission from a surface state on GaN(0001)-(1{times}1). The symmetry of this surface state is even with respect to the mirror planes of the surface and polarization measurements indicate that it is of sp{sub z} character, consistent with a dangling-bond state. {copyright} {ital 1997} {ital The American Physical Society}},
doi = {10.1103/PhysRevB.56.10271},
url = {https://www.osti.gov/biblio/543828}, journal = {Physical Review, B: Condensed Matter},
number = 16,
volume = 56,
place = {United States},
year = {Wed Oct 01 00:00:00 EDT 1997},
month = {Wed Oct 01 00:00:00 EDT 1997}
}