Gallium self-diffusion in gallium phosphide
- University of California at Berkeley and Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
- Charles Evans Associates, Redwood City, California 94063 (United States)
- Max-Planck-Institut fuer Festkoerperforschung, Heisenbergstrasse 1, D-70569 Stuttgart (Germany)
- Instituto de Microelectronica de Madrid, Centro Nacional de Microelectronica, CSIC, Serrano 144, 28066 Madrid (Spain)
Ga self-diffusion in gallium phosphide (GaP) is measured directly in isotopically controlled GaP heterostructures. Secondary ion mass spectroscopy (SIMS) is used to monitor intermixing of {sup 69}Ga and {sup 71}Ga between isotopically pure GaP epilayers which are grown by molecular beam epitaxy (MBE) on GaP substrates. The Ga self-diffusion coefficient in undoped GaP is determined to be {ital D}=2.0 cm{sup 2}s{sup {minus}1} exp({minus}4.5eV/k{sub B}T) between 1000 and 1190{degree}C under phosphorus-rich condition. The self-diffusion entropy is found to be {approximately}4 k{sub B}. {copyright} {ital 1997 American Institute of Physics.}
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 534418
- Journal Information:
- Applied Physics Letters, Vol. 70, Issue 14; Other Information: PBD: Apr 1997
- Country of Publication:
- United States
- Language:
- English
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