The growth of Ag films on Ni(100)

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States)

DOI:https://doi.org/10.1116/1.585495· OSTI ID:5287256

Brodde, A; Wilhelmi, G; Badt, D; Wengelnik, H; Neddermeyer, H ^[1]

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1. Ruhr-Univ. Bochum (Germany)

This paper reports on using scanning tunneling microscopy (STM), low energy electron diffraction (LEED), and Auger electron spectroscopy (AES) to study the growth of Ag films with coverages between 1/6 and 1.45 monolayers on room temperature Ni(100) substrates. In the submonolayer coverage range we observe a condensation of the Ag deposit in form of a network of connected islands of monoatomic height preferentially at step edges of the substrate. Two domains are identified on the Ag islands by the presence of orthogonal line structures. They are interpreted in terms of the c(2{times}8) LEED pattern. The Ag islands coalesce for a coverage of less than one monolayer. The second atomic Ag layer shows a different growth structure indicating a more perfect arrangement of Ag atoms in a face-centered-cubic (fcc) (111) layer.

• OSTI ID: 5287256
• Journal Information: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States), Vol. 9:2; ISSN 0734-211X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
NICKEL
COATINGS
SILVER
CRYSTAL STRUCTURE
AUGER ELECTRON SPECTROSCOPY
CRYSTAL GROWTH
ELECTRON DIFFRACTION
LATTICE PARAMETERS
MICROSCOPY
SUBSTRATES
THIN FILMS
TUNNEL EFFECT
COHERENT SCATTERING
DIFFRACTION
ELECTRON SPECTROSCOPY
ELEMENTS
FILMS
METALS
SCATTERING
SPECTROSCOPY
TRANSITION ELEMENTS
360102* - Metals & Alloys- Structure & Phase Studies