Optical constants and electrical properties of thin VO/sub 2/ films near the phase transition
Journal Article
·
· Sov. Tech. Phys. Lett. (Engl. Transl.); (United States)
OSTI ID:5282956
VO/sub 2/ films with thickness less than 1000 A were studied over the temperature range 20-100/sup 0/C. The electric resistivity was determined by the Four-probe method while the optical properties were examined by ellipsometric techniques.(AIP)
- Research Organization:
- Institute of Physics of Semiconductors, Siberian Branch, Academy of Sciences of the USSR
- OSTI ID:
- 5282956
- Journal Information:
- Sov. Tech. Phys. Lett. (Engl. Transl.); (United States), Vol. 3:5
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
VANADIUM OXIDES
CRYSTAL-PHASE TRANSFORMATIONS
ELECTRIC CONDUCTIVITY
OPTICAL PROPERTIES
FILMS
MEDIUM TEMPERATURE
CHALCOGENIDES
ELECTRICAL PROPERTIES
OXIDES
OXYGEN COMPOUNDS
PHASE TRANSFORMATIONS
PHYSICAL PROPERTIES
TRANSITION ELEMENT COMPOUNDS
VANADIUM COMPOUNDS
360204* - Ceramics
Cermets
& Refractories- Physical Properties
360202 - Ceramics
Cermets
& Refractories- Structure & Phase Studies
VANADIUM OXIDES
CRYSTAL-PHASE TRANSFORMATIONS
ELECTRIC CONDUCTIVITY
OPTICAL PROPERTIES
FILMS
MEDIUM TEMPERATURE
CHALCOGENIDES
ELECTRICAL PROPERTIES
OXIDES
OXYGEN COMPOUNDS
PHASE TRANSFORMATIONS
PHYSICAL PROPERTIES
TRANSITION ELEMENT COMPOUNDS
VANADIUM COMPOUNDS
360204* - Ceramics
Cermets
& Refractories- Physical Properties
360202 - Ceramics
Cermets
& Refractories- Structure & Phase Studies