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Title: Magnetic properties of Sm-Ti-Fe and Nd-Ti-Fe hard and soft sputtered phases

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.340665· OSTI ID:5279498

A series of Sm-Ti-Fe and Nd-Ti-Fe film samples have been synthesized by rf diode sputtering for Fe-rich compositions. Samples have been directly crystallized onto heated substrates as well as first deposited amorphous and then subsequently crystallized. In the film plane magnetic fields have been applied during the deposition and during the crystallization to induce in-the-film-plane anisotropies into the films. A phase that contained only Sm, Ti, and Fe has been synthesized in film form that exhibited an in-plane intrinsic coercive force, /sub i/H/sub c/, of 31 kOe at room temperature and 58 kOe at 5 K. Tetragonal lattice parameters with a = 8.391 A and c = 12.297 A have been assigned to the high /sub i/H/sub c/ phase by a fitting to 12 diffraction lines. The Nd-Ti-Fe and the Sm-Ti-Fe systems also exhibited a soft magnetic phase of the ThMn/sub 12/-type at a nominal composition of Nd(TiFe/sub 11/).

Research Organization:
Physics Department, Queens College of CUNY, Flushing, New York 11367
OSTI ID:
5279498
Journal Information:
J. Appl. Phys.; (United States), Vol. 63:8
Country of Publication:
United States
Language:
English