Exponential decay and exponential recovery of modal gains in high count rate channel electron multipliers

Journal Article · Tue Jul 01 00:00:00 EDT 1980 · Rev. Sci. Instrum.; (United States)

DOI:https://doi.org/10.1063/1.1136329· OSTI ID:5268715

Hahn, S F; Burch, J L

A series of data on high count rate channel electron multipliers revealed an initial drop and subsequent recovery of gains in exponential fashion. The FWHM of the pulse height distribution at the initial stage of testing can be used as a good criterion for the selection of operating bias voltage of the channel electron multiplier.

• Research Organization: Southwest Research Institute, San Antonio, Texas 78284
• OSTI ID: 5268715
• Journal Information: Rev. Sci. Instrum.; (United States), Vol. 51:7
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
ELECTRON MULTIPLIERS
GAIN
DATA
ELECTRIC POTENTIAL
OPTIMIZATION
PULSE DISCRIMINATORS
PULSES
VARIATIONS
DISCRIMINATORS
ELECTRON TUBES
ELECTRONIC CIRCUITS
INFORMATION
PULSE CIRCUITS
420800* - Engineering- Electronic Circuits & Devices- (-1989)