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Title: Vibrational Raman characterization of hard carbon and diamond films

Conference ·
OSTI ID:5235269
; ; ;  [1];  [2]
  1. Lawrence Berkeley Lab., CA (United States)
  2. Seagate Magnetics, Fremont, CA (United States)

Amorphous hard carbon'' and microcrystalline diamond films are being investigated and characterized using high-sensitivity and spatial-profiling Raman spectroscopy. The hard carbon'' films have broad Raman spectra with no diamond line while higher quality diamond films show only a single sharp diamond line. Features in the Raman spectra of the amorphous hard carbon'' films correlate with the rates of specific types of wear. Changes in the relative intensity of the Raman band near 1570 cm{sup {minus}1} (G-band) compared to the band near 1360 cm{sup {minus}1} (D-band) are related to the rate of abrasive wear. Shifts in the frequency of the G-band are related to the rate of tribochemical wear. The results are consistent with a structural model of amorphous carbon films in which small (<20{Angstrom}) graphitic microcrystals comprised of sp{sup 2} bonded domains are cross-linked by sp{sup 3} carbon atoms. Profiles of Raman frequency and linewidth obtained from spatially resolved Raman spectroscopy across CVD-grown diamond thin films show that the Raman frequency and position are correlated in these films and that both change in regions of poorer film quality. 14 refs., 4 figs.

Research Organization:
Lawrence Berkeley Lab., CA (United States)
Sponsoring Organization:
USDOE; USDOE, Washington, DC (United States)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
5235269
Report Number(s):
LBL-30148; CONF-910123-35; ON: DE92000901
Resource Relation:
Conference: OE/LASE '91: 4th Society of Photo-Optical Instrumentation Engineers (SPIE) international symposium, Los Angeles, CA (United States), 20-25 Jan 1991
Country of Publication:
United States
Language:
English

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