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Title: Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface

Abstract

Synchrotron x-ray scattering has been used to investigate the structure and growth of xenon films physisorbed on the Ag(111) surface. For growth under quasiequilibrium conditions, the bulk Xe-Xe spacing is reached at monolayer completion and fcc films of thickness [ge]220 A are observed. Under kinetic growth conditions, intensity oscillations in the specular reflectivity as a function of time demonstrate nearly layer-by-layer growth. Modeling of the intensity at a fixed coverage allows profiling of the Xe/vacuum interface as well as a direct determination of the film's thickness and layer spacings.

Authors:
; ; ; ;  [1]
  1. Department of Physics and Astronomy, University of Missouri-Columbia, Columbia, Missouri 65211 (United States) School of Materials Engineering, Purdue University, West Lafayette, Indiana 47907 (United States)
Publication Date:
OSTI Identifier:
5226168
DOE Contract Number:  
FG02-85ER45183
Resource Type:
Journal Article
Journal Name:
Physical Review Letters; (United States)
Additional Journal Information:
Journal Volume: 72:5; Journal ID: ISSN 0031-9007
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; XENON; ADSORPTION; CRYSTAL GROWTH; CRYSTAL STRUCTURE; FCC LATTICES; INTERFACES; LATTICE PARAMETERS; REFLECTIVITY; SYNCHROTRON RADIATION; TEMPERATURE DEPENDENCE; TIME DEPENDENCE; X-RAY DIFFRACTION; BREMSSTRAHLUNG; COHERENT SCATTERING; CRYSTAL LATTICES; CUBIC LATTICES; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; GASES; NONMETALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; RARE GASES; SCATTERING; SORPTION; SURFACE PROPERTIES; 360602* - Other Materials- Structure & Phase Studies

Citation Formats

Dai, P, Angot, T, Ehrlich, S N, Wang, S, and Taub, H. Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface. United States: N. p., 1994. Web. doi:10.1103/PhysRevLett.72.685.
Dai, P, Angot, T, Ehrlich, S N, Wang, S, & Taub, H. Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface. United States. doi:10.1103/PhysRevLett.72.685.
Dai, P, Angot, T, Ehrlich, S N, Wang, S, and Taub, H. Mon . "Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface". United States. doi:10.1103/PhysRevLett.72.685.
@article{osti_5226168,
title = {Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface},
author = {Dai, P and Angot, T and Ehrlich, S N and Wang, S and Taub, H},
abstractNote = {Synchrotron x-ray scattering has been used to investigate the structure and growth of xenon films physisorbed on the Ag(111) surface. For growth under quasiequilibrium conditions, the bulk Xe-Xe spacing is reached at monolayer completion and fcc films of thickness [ge]220 A are observed. Under kinetic growth conditions, intensity oscillations in the specular reflectivity as a function of time demonstrate nearly layer-by-layer growth. Modeling of the intensity at a fixed coverage allows profiling of the Xe/vacuum interface as well as a direct determination of the film's thickness and layer spacings.},
doi = {10.1103/PhysRevLett.72.685},
journal = {Physical Review Letters; (United States)},
issn = {0031-9007},
number = ,
volume = 72:5,
place = {United States},
year = {1994},
month = {1}
}