Evaluation of unencapsulated ceramic monolithic and MOS thin-film capacitors (25 to 300/sup 0/C)
Several commercial monolithic ceramic and thin-film MOS chip capacitors were evaluated for use in high temperature (300/sup 0/C) geothermal instrumentation. Characteristics of the commonly used dielectric materials (NPO, X7R, BX) and temperature dependence of the insulation resistance are briefly discussed. Some ceramic capacitors with NPO dielectric materials had insulation resistances above 10 megohms at 300/sup 0/C and less than 2% change in capacitance from 25/sup 0/C to 300/sup 0/C, while the X7R and BX dielectric materials exhibited insulation resistances below 10 megohm and changes in capacitance greater then 50%. The thin-film capacitors showed good stability at 300/sup 0/C. However, during aging, bonds and bond pads presented a problem causing intermittently open circuits for some of the devices.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 5217779
- Report Number(s):
- SAND-82-0158; ON: DE82014359; TRN: 82-013872
- Resource Relation:
- Other Information: Portions of document are illegible
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
15 GEOTHERMAL ENERGY
CAPACITORS
COMPARATIVE EVALUATIONS
WELL LOGGING EQUIPMENT
AGING
CAPACITANCE
CERAMICS
DIELECTRIC MATERIALS
DISSIPATION FACTOR
ELECTRIC CONDUCTIVITY
EXPERIMENTAL DATA
FILMS
HIGH TEMPERATURE
STABILITY
TEMPERATURE DEPENDENCE
TESTING
DATA
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
EQUIPMENT
INFORMATION
MATERIALS
NUMERICAL DATA
PHYSICAL PROPERTIES
Geothermal Legacy
440400* - Well Logging Instrumentation
150303 - Geothermal Exploration & Exploration Technology- Exploratory Drilling & Well Logging