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Title: L-subshells ionization of Yb and Au by fast heavy ions

Miscellaneous ·
OSTI ID:5189915

This work addresses the problem of L-subshell ionization by fast heavy ions incident on solid targets. Measurements of L x-ray production following bombardment of Yb and Au solid targets by {sup 1}H, {sup 7}Li, {sup 9}Be, {sup 12}C, {sup 14}N, {sup 19}F, and {sup 28}Si ions for an incident energy range of 0.5-3.0 MeV/amu have been done. Throughout this work the x-ray production cross sections {sigma}{sub L{sub {alpha}1.2}} and {sigma}{sub L{sub {gamma}2.3,(6)}} for the specified targets by incident ions of Le, Be, C, N, F, and Si ions have been measured. The author's main interest has been directed toward the measurements of the x-ray intensity ratios, L{sub {alpha}1,2}/L{sub {gamma}2.3,(6)} as a function of projectile velocity (E{sub p}/amu) and projectile atomic number Z{sub 1}. This ratio is directly related to the ratio of ionization cross sections for L{sub III}- and L{sub I}-subshells. He observed that there is a large systematic change in the energy dependence of the peak structure of the x-ray yield ratio L{sub {alpha}1,2}/L{sub {gamma}2.3,(6)}, which he believes is related to distortion of the 2s bound electron wave function in the entrance channel. The peak structure only exists because of the 2s{sub 1/2} nature of the L{sub 1}, which indicates a strong distortion in the initial target electron state, by the incoming projectile, for the 2s{sub 1/2} electrons in the L{sub I}-subshell. This distortion increases with increasing projectile atomic Z{sup 1}. The x-ray yield ratios and the production cross sections have been compared to several theories that try to explain the mechanisms of inner shell ionization. A lack of agreement between the data and the published theories suggests the need of an improvement in the theoretical description of inner shell ionization by fast heavy ions.

Research Organization:
Kansas State Univ., Manhattan, KS (United States)
OSTI ID:
5189915
Resource Relation:
Other Information: Thesis (Ph.D.)
Country of Publication:
United States
Language:
English