Comparison of synchrotron x-ray microanalysis with electron and proton microscopy for individual particle analysis

Conference · Tue Jan 01 00:00:00 EST 1991

OSTI ID:5189702

Janssens, K H; van Langevelde, F; Adams, F C ^[1]; Vis, R D ^[2]; Sutton, S R; Rivers, M L ^[3]; Jones, K W ^[4]; Bowen, D K ^[5]

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1. Universitaire Instelling Antwerpen, Antwerp (Belgium)
2. Vrije Univ., Amsterdam (Netherlands)
3. Chicago Univ., IL (United States)
4. Brookhaven National Lab., Upton, NY (United States)
5. Warwick Univ., Coventry (United Kingdom)

This paper is concerned with the evaluation of the use of synchrotron/radiation induced x-ray fluorescences ({mu}-SRXRF) as implemented at two existing X-ray microprobes for the analysis of individual particles. As representative environmental particulates, National Institutes of Science and Technology (NIST) K227, K309, K441 and K961 glass microspheres were analyzed using two types of X-ray micro probes: the white light microprobe at beamline X26A of the monochromatic (15 keV) X-ray microprobe at station 7.6 of the SRS. For reference, the particles were also analyzed with microanalytical techniques more commonly employed for individual particles analysis such as EPMA and micro-PIXE.

• Research Organization: Brookhaven National Lab., Upton, NY (United States)
• Sponsoring Organization: USDOE; National Aeronautic and Space Administration (NASA); National Science Foundation (NSF); NLZWO; UKSERC; BENSF; USDOE, Washington, DC (United States); National Aeronautics and Space Administration, Washington, DC (United States); National Science Foundation, Washington, DC (United States); Nederlandse Organisatie voor Zuiver-Wetenschappelijk Onderzoek (ZWO), The Hague (Netherlands); Science and Engineering Research Council, Swindon (United Kingdom); Belgian National Science Fund (Belgium)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 5189702
• Report Number(s): BNL-46335; CONF-910862-8; ON: DE92014690; CNN: EAR 89-15699; NAG 9-106
• Resource Relation: Conference: Pacific-international congress on x-ray analytical methods, Honolulu, HI (United States), 12-16 Aug 1991
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
PARTICULATES
X-RAY FLUORESCENCE ANALYSIS
COMPARATIVE EVALUATIONS
ELECTRON MICROSCOPY
MICROANALYSIS
X-RAY SPECTRA
CHEMICAL ANALYSIS
EVALUATION
MICROSCOPY
NONDESTRUCTIVE ANALYSIS
PARTICLES
SPECTRA
X-RAY EMISSION ANALYSIS
665100* - Nuclear Techniques in Condensed Matter Physics - (1992-)