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Title: Integration of point-contact microscopy and atomic force microscopy: application to characterization of graphite/Pt(111)

Abstract

The electrical current through the point-contact junction of an AFM tip is used to image the surfaces of bulk graphite (HOPG) and the surface of a graphitized carbon monolayer on Pt(111) under ultra-high vacuum (UHV) conditions. Lattice-resolved images are obtained simultaneously in topography, lateral friction, and contact current channels. Lattice resolution in current maps persisted up to 0.9 mA and pressures of up to 5 GPa. In both bulk graphite and the case of graphitized carbon monolayer on Pt(111), the current images show only one maximum per unit cell. In addition, the contact current images of the graphite monolayer reveal local conductivity variations. The authors observed local conductivity variations in the form of Moire superstructures resulting from high order commensurability with the Pt lattice.

Authors:
; ; ;
Publication Date:
Research Org.:
Lawrence Berkeley National Lab., CA (United States)
Sponsoring Org.:
USDOE Director, Office of Science. Office of Basic Energy Studies. Division of Materials Sciences (United States)
OSTI Identifier:
5175117
Report Number(s):
LBNL-44137; No.259
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Journal Article
Journal Name:
Physical Review B
Additional Journal Information:
Journal Volume: 60:24
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; GRAPHITE; PLATINUM; CRYSTAL LATTICES; ATOMIC FORCE MICROSCOPY; CARBON; ELECTRIC CONDUCTIVITY; MINERALS; PLATINUM METALS; CRYSTAL STRUCTURE; MICROSCOPY; NONMETALS; ELECTRICAL PROPERTIES; TRANSITION ELEMENTS; ELEMENTS; PHYSICAL PROPERTIES; METALS; 360602* - Other Materials- Structure & Phase Studies; 360606 - Other Materials- Physical Properties- (1992-)

Citation Formats

Enachescu, M., Schleef, D., Ogletree, D.F., and Salmeron, M. Integration of point-contact microscopy and atomic force microscopy: application to characterization of graphite/Pt(111). United States: N. p., 1999. Web. doi:10.1103/PhysRevB.60.16913.
Enachescu, M., Schleef, D., Ogletree, D.F., & Salmeron, M. Integration of point-contact microscopy and atomic force microscopy: application to characterization of graphite/Pt(111). United States. doi:10.1103/PhysRevB.60.16913.
Enachescu, M., Schleef, D., Ogletree, D.F., and Salmeron, M. Thu . "Integration of point-contact microscopy and atomic force microscopy: application to characterization of graphite/Pt(111)". United States. doi:10.1103/PhysRevB.60.16913.
@article{osti_5175117,
title = {Integration of point-contact microscopy and atomic force microscopy: application to characterization of graphite/Pt(111)},
author = {Enachescu, M. and Schleef, D. and Ogletree, D.F. and Salmeron, M.},
abstractNote = {The electrical current through the point-contact junction of an AFM tip is used to image the surfaces of bulk graphite (HOPG) and the surface of a graphitized carbon monolayer on Pt(111) under ultra-high vacuum (UHV) conditions. Lattice-resolved images are obtained simultaneously in topography, lateral friction, and contact current channels. Lattice resolution in current maps persisted up to 0.9 mA and pressures of up to 5 GPa. In both bulk graphite and the case of graphitized carbon monolayer on Pt(111), the current images show only one maximum per unit cell. In addition, the contact current images of the graphite monolayer reveal local conductivity variations. The authors observed local conductivity variations in the form of Moire superstructures resulting from high order commensurability with the Pt lattice.},
doi = {10.1103/PhysRevB.60.16913},
journal = {Physical Review B},
number = ,
volume = 60:24,
place = {United States},
year = {1999},
month = {8}
}