Direct structural determination by inversion of experimental diffuse low-energy electron diffraction intensities

Journal Article · Mon Apr 11 00:00:00 EDT 1994 · Physical Review Letters; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.72.2434· OSTI ID:5120592

Wei, C M; Tong, S Y; Wedler, H; Mendez, M A; Heinz, K ^[1]

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1. Institute of Physics, Academia Sinica, Nankang, Taipei, Taiwan 11529 (Taiwan, Province of China) Department of Physics and Laboratory for Surface Studies, University of Wisconsin-Milwaukee, Milwaukee, Wisconsin 53201 (United States) Lehrstuhl fuer Festkoerperphysik, Universitaet Erlangen-Nuernberg, Staudstrasse 7, D-91058 Erlangen (Germany)

We demonstrate that two-dimensionally resolved diffuse low-energy electron diffraction intensities can be measured with sufficient accuracy and at multiple energies to allow direct inversion for a low coverage (5%) disordered K/Ni(100) surface. The data inversion reveals three-dimensional coordinates of atoms with atom images whose full width at half maximum is less that 1 A in all spatial directions. By varying the angle of incidence, first layer and second layer near-neighbor Ni atoms are separately imaged. This is the first demonstration of multiple-energy internal-source electron holography using measured elastically backscattered electrons.

• DOE Contract Number: FG02-84ER45076
• OSTI ID: 5120592
• Journal Information: Physical Review Letters; (United States), Vol. 72:15; ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ELECTRON DIFFRACTION
HOLOGRAPHY
POTASSIUM
ADSORPTION
IMAGE PROCESSING
INCIDENCE ANGLE
INVERSE SCATTERING PROBLEM
MEASURING METHODS
MORPHOLOGY
NICKEL
SURFACE PROPERTIES
ALKALI METALS
COHERENT SCATTERING
DIFFRACTION
ELEMENTS
METALS
PROCESSING
SCATTERING
SORPTION
TRANSITION ELEMENTS
360102* - Metals & Alloys- Structure & Phase Studies
665100 - Nuclear Techniques in Condensed Matter Physics - (1992-)