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Title: Measurement of the /sup 32/Si half-life via accelerator mass spectrometry

Journal Article · · Phys. Rev. Lett.; (United States)

The half-life of /sup 32/Si has been measured to be T/sub 1/2/=101 +- 18 yr, considerably shorter than the previously accepted value of approx. =300 yr. The new value was obtained by measuring the specific ..beta.. activity with a liquid--scintillation-counter technique and the /sup 32/Si concentration with tandem-accelerator mass spectrometry. It is expected that the present result will have a strong impact on studies with cosmogenic /sup 32/Si.

Research Organization:
Argonne National Laboratory, Argonne, Illinois 60439
OSTI ID:
5119754
Journal Information:
Phys. Rev. Lett.; (United States), Vol. 45:8
Country of Publication:
United States
Language:
English