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Title: e -beam melted icosahedral Al-Mn surface layers: Microstructures and phason defects

Journal Article · · Journal of Materials Research; (USA)
;  [1]
  1. Sandia National Laboratories, Albuquerque, New Mexico 87185-5800 (US)

The microstructure of icosahedral Al(Mn) in melt-quenched surface alloys has been characterized with TEM. Single-phase alloys with 20 at. % Mn show angular misorientations (up to {similar to}7{degree}) across internal boundaries radiating from the nucleation centers of grains. Lowering the Mn content results in fcc Al at grain boundaries and between branches of the icosahedral grains; the presence of Al-rich liquid around growing grains apparently eliminates the misorientations seen with 20 at. % Mn. The grains have a dense distribution of dislocation-like defects, but have sufficient orientational order to exhibit well--defined diffraction contours. Weak reflections in diffraction patterns from small areas (0.7 {mu}m) of grains exhibit deviations from exact icosahedral symmetry positions which were analyzed to evaluate a phase strain tensor and characterize misordering defects in the quasicrystalline structure. A negative matrix element ({ital m}{approx}{minus}0.05) for a tensor axis along a two-fold icosahedral axis accounts for most of the distortions in these patterns and those from other melt-quenched icosahedral Al(Mn) and Al(Mn,Si) alloys; this dominant element lowers the symmetry to {ital D}{sub 2}. This axis is nearly perpendicular to the growth direction, which suggests that the misordering is due to rapid growth during the quench; however, the {ital D}{sub 2} distortion may also result from an elastic instability predicted for icosahedral phases. Distortions in Al(Cr,Ru) can be fit with a similar tensor but with {ital m}{gt}0. Thus the phason character identified here may apply to other aluminum-transition metal icosahedral phases as well.

DOE Contract Number:
AC04-76DP00789
OSTI ID:
5046330
Journal Information:
Journal of Materials Research; (USA), Vol. 4:6; ISSN 0884-2914
Country of Publication:
United States
Language:
English