ELECTRON-SPIN PARAMAGNETIC RESONANCE STUDIES OF IRRADIATED ALUMINO-SILICATE GLASSES
Electron-spin paramagnetic resonance (ESPR) spectra were obtained at both room and liquid nitrogen temperature from several alumino--silicate glasses, and one sodalumino-- silicate glass, which have received x-ray or neutron irradiation. Two distinct types of resonance were observed in alumino--silicate glasses after x-ray irradiation. One is partially resolved into six equally spaced lines with a separation of 8.1 gauss between adjacent lines; the other resonance is an asymmetric line with a width of approximately 18 gauss between inflection points of the absorption curve. The latter resonance is more readily observed ifter heating the sample to 350 deg C, at which temperature the resonance exhibiting the six equally spaced lines disappears. It is suggested that the six-line structure arises from a hole trapped on a bridging oxygen which is bonded to a substitutional Al- ion, and that the broad asymmetric resonance is due to a hole trapped on a non-bridging oxygen. The measurements of the ESPR intensity of these resonances as a function of Al/sub 1/O/sub 3/ content in the glasses indicate that the impurity ions which enable some Al- ions to substitute for Si atoms are contained in the SiO/sub 2/ employed, and that in addition, Al/ sub 2/O/sub 3/ can act as a modifier oxide and produce non-bridging oxygen ions. Only the broad asymmetric resonance is observed in the x-ray irradiated soda- alumino-- silicate glass; the Na/sub 2/O is principally responsible for the non- bridging oxygens on which ioles are trapped when this glass is x-ray irradiated. Teutron irradiation of all of the glasses produces the same pectra of x-ray irradiation except for the addition of a single sharp, intense line which is ascribed to trapped electrons in the silica network. (auth)
- Research Organization:
- Brown Univ., Providence
- NSA Number:
- NSA-16-027718
- OSTI ID:
- 4799063
- Journal Information:
- Phys. and Chem. Glasses, Vol. Vol: 3; Other Information: Orig. Receipt Date: 31-DEC-62
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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Related Subjects
ALUMINUM
ALUMINUM OXIDES
ALUMINUM SILICATES
ATOMS
CONFIGURATION
DEFECTS
ELECTRONS
GLASS
HEATING
IMPURITIES
IONS
LATTICES
LOW TEMPERATURE
MAGNETIC RESONANCE
NEUTRON BEAMS
OXYGEN
QUANTITY RATIO
RADIATION EFFECTS
SILICON
SILICON OXIDES
SODIUM OXIDES
SPECTRA
SPIN
TRAPS
X RADIATION