XPS/GIXS study of thin oxide films formed on the Fe-40%Cr alloy with trace of manganese

Journal Article · Tue Apr 15 00:00:00 EDT 1997 · Scripta Materialia

DOI:https://doi.org/10.1016/S1359-6462(96)00466-6· OSTI ID:477124

Suzuki, S; Kosaka, T; Saito, M; Inoue, H; Waseda, Y; Oku, M ^[1]; Matsubara, E ^[2]

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1. Tohoku Univ., Sendai (Japan)
2. Kyoto Univ. (Japan). Graduate School

Manganese which is very often added to steels is known to be significantly enriched to the surface with oxidation even if manganese concentration is less than 1% in iron alloys. Such enrichment of a small amount of manganese on the surface during oxidation in stainless steels is well recognized by glow discharge optical emission spectrometry (GDOS). However, the chemical state of such enriched manganese on the surface of iron and steels has not been understood yet. The objective of this work is to provide information of the structure and compositional distribution of a thin oxide film formed on the Fe-40 mass%Cr alloy using XPS depth profiling, angle resolved XPS (AR-XPS), and GIXS. This includes the chemical state of a small amount of manganese as well as iron and chromium.

• OSTI ID: 477124
• Journal Information: Scripta Materialia, Vol. 36, Issue 8; Other Information: PBD: 15 Apr 1997
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
OXIDATION
IRON ALLOYS
CHROMIUM ALLOYS
MANGANESE ADDITIONS
THIN FILMS
CHEMICAL ANALYSIS
METALLURGICAL EFFECTS