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Title: In situ observation of deformation-induced interface migration in a fully-lamellar TiAl alloy

Abstract

It has been reported previously that the mobility of interfacial dislocations plays a dominant role in the creep deformation behavior of a fully-lamellar (FL) TiAl alloy fabricated by powder metallurgy (P/M). Since the motion of lattice dislocations within the {gamma} lamellae is largely restricted by a refined lamellar spacing within the P/M alloy, the deformation strain is mainly accommodated by the motion of the interfacial dislocations. The creep resistance of the P/M alloy significantly increases when the motion of interfacial dislocations in the twin ({gamma}/{gamma}{sub T}) or interphase ({gamma}/{alpha}{sub 2}) interface is effectively hindered by a well developed deformation substructure such as mechanical (deformation) twins. In parallel to this study, other investigation reported in the literature have also suggested that the lamellar interfaces of TiAl are glissile. It is possible that the lamellar interfaces in TiAl, under certain circumstances, could migrate (advance) directly through the cooperative motion of interfacial dislocations. That is, the {gamma}/{gamma}{sub T} or {gamma}/{alpha}{sub 2} interface can migrate through the cooperative motion of interfacial dislocations and lead to the growth or shrinkage of the {gamma} or {alpha}{sub 2} lamellae. Therefore, a deformation-induced interfacial instability in fully-lamellar TiAl alloys could result in a weakening effect when the alloysmore » are employed for engineering applications. Although it is anticipated that the interface migration is prevalent at elevated temperatures, the present study, in fact, addresses the influence of deformation on the stability of lamellar interfaces at room temperature. An in situ straining experiment in a transmission electron microscope was incorporated for the investigation.« less

Authors:
; ;  [1]
  1. Lawrence Livermore National Lab., CA (United States)
Publication Date:
OSTI Identifier:
474217
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Journal Article
Journal Name:
Scripta Materialia
Additional Journal Information:
Journal Volume: 36; Journal Issue: 9; Other Information: PBD: 1 May 1997
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; DEFORMATION; MICROSTRUCTURE; TITANIUM ALLOYS; ALUMINIUM ALLOYS; CHROMIUM ALLOYS; NIOBIUM ALLOYS; TANTALUM ALLOYS; SAMPLE PREPARATION; POWDERS; EXTRUSION; ANNEALING; DISLOCATIONS; INTERFACES; LAMELLAE

Citation Formats

Hsiung, L M, Schwartz, A J, and Nieh, T G. In situ observation of deformation-induced interface migration in a fully-lamellar TiAl alloy. United States: N. p., 1997. Web. doi:10.1016/S1359-6462(96)00480-0.
Hsiung, L M, Schwartz, A J, & Nieh, T G. In situ observation of deformation-induced interface migration in a fully-lamellar TiAl alloy. United States. https://doi.org/10.1016/S1359-6462(96)00480-0
Hsiung, L M, Schwartz, A J, and Nieh, T G. 1997. "In situ observation of deformation-induced interface migration in a fully-lamellar TiAl alloy". United States. https://doi.org/10.1016/S1359-6462(96)00480-0.
@article{osti_474217,
title = {In situ observation of deformation-induced interface migration in a fully-lamellar TiAl alloy},
author = {Hsiung, L M and Schwartz, A J and Nieh, T G},
abstractNote = {It has been reported previously that the mobility of interfacial dislocations plays a dominant role in the creep deformation behavior of a fully-lamellar (FL) TiAl alloy fabricated by powder metallurgy (P/M). Since the motion of lattice dislocations within the {gamma} lamellae is largely restricted by a refined lamellar spacing within the P/M alloy, the deformation strain is mainly accommodated by the motion of the interfacial dislocations. The creep resistance of the P/M alloy significantly increases when the motion of interfacial dislocations in the twin ({gamma}/{gamma}{sub T}) or interphase ({gamma}/{alpha}{sub 2}) interface is effectively hindered by a well developed deformation substructure such as mechanical (deformation) twins. In parallel to this study, other investigation reported in the literature have also suggested that the lamellar interfaces of TiAl are glissile. It is possible that the lamellar interfaces in TiAl, under certain circumstances, could migrate (advance) directly through the cooperative motion of interfacial dislocations. That is, the {gamma}/{gamma}{sub T} or {gamma}/{alpha}{sub 2} interface can migrate through the cooperative motion of interfacial dislocations and lead to the growth or shrinkage of the {gamma} or {alpha}{sub 2} lamellae. Therefore, a deformation-induced interfacial instability in fully-lamellar TiAl alloys could result in a weakening effect when the alloys are employed for engineering applications. Although it is anticipated that the interface migration is prevalent at elevated temperatures, the present study, in fact, addresses the influence of deformation on the stability of lamellar interfaces at room temperature. An in situ straining experiment in a transmission electron microscope was incorporated for the investigation.},
doi = {10.1016/S1359-6462(96)00480-0},
url = {https://www.osti.gov/biblio/474217}, journal = {Scripta Materialia},
number = 9,
volume = 36,
place = {United States},
year = {Thu May 01 00:00:00 EDT 1997},
month = {Thu May 01 00:00:00 EDT 1997}
}