skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Study of low temperature microcreep in niobium single crystals

Abstract

The activation volume, thermal activation enthalpy and total activation enthalpy have been measured from 5°K to 310°K during microcreep of pure and doped niobium single crystals. Results are discussed in terms of dislocation motion past short range obstacles through the combined effect of applied stress and thermal activation.

Authors:
 [1]
  1. Univ. of Illinois, Urbana, IL (United States)
Publication Date:
Research Org.:
Univ. of Illinois at Urbana-Champaign, IL (United States)
Sponsoring Org.:
US Atomic Energy Commission (AEC)
OSTI Identifier:
4692698
Report Number(s):
COO-1198-909
NSA Number:
NSA-26-043509
DOE Contract Number:  
AT(11-1)-1198
Resource Type:
Thesis/Dissertation
Resource Relation:
Other Information: Thesis. UNCL. Orig. Receipt Date: 31-DEC-72
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ACTIVATION ENERGY; CREEP; DATA; LOW TEMPERATURE; MEDIUM TEMPERATURE; MONOCRYSTALS; NIOBIUM; TEMPERATURE DEPENDENCE; ULTRALOW TEMPERATURE; VERY LOW TEMPERATURE; NIOBIUM/creep in monocrystals of; at low temperatures; studies of thermally-activated micro-

Citation Formats

Bluem, Melvin Francis. Study of low temperature microcreep in niobium single crystals. United States: N. p., 1972. Web. doi:10.2172/4692698.
Bluem, Melvin Francis. Study of low temperature microcreep in niobium single crystals. United States. https://doi.org/10.2172/4692698
Bluem, Melvin Francis. 1972. "Study of low temperature microcreep in niobium single crystals". United States. https://doi.org/10.2172/4692698. https://www.osti.gov/servlets/purl/4692698.
@article{osti_4692698,
title = {Study of low temperature microcreep in niobium single crystals},
author = {Bluem, Melvin Francis},
abstractNote = {The activation volume, thermal activation enthalpy and total activation enthalpy have been measured from 5°K to 310°K during microcreep of pure and doped niobium single crystals. Results are discussed in terms of dislocation motion past short range obstacles through the combined effect of applied stress and thermal activation.},
doi = {10.2172/4692698},
url = {https://www.osti.gov/biblio/4692698}, journal = {},
number = ,
volume = ,
place = {United States},
year = {1972},
month = {6}
}

Thesis/Dissertation:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this thesis or dissertation.

Save / Share: