CONSIDERATION ON THE WEAKENING PHENOMENON OF FILAMENT USED FOR ELECTRIC LAMPS BY P-32 TRACER TECHNIQUE (in Japanese)
The filament of high-wattage electric lamps using red phosphorus as getter has a tendency to down at the end parts. According to the metallurgical study, the phenomenon seems to be caused by phosphorus. Hence an attempt was made to trace the behavior of a smail amount of phosphorus on the filament with the aid of radioactive red phosphorus, P/sup 32/, in order to make clear the role of phosphorus in the weakening phenomenon by comparing the results with the metallurgical observation. Radioactive red phosphorus obtained as an irradiated unit was refined chemically, powdered, and spread on the filaments in the form of an alcoholic suspension. The test lamps using these filaments were raade and then running tests were carried out under several conditions. After running tests the filaments were taken out and the phosphorus remaining on the fllaments was determined by beta counting. The distribution of phosphorus on the filaments was observed by autoradiography. Before running tests, 247 plus or minus 57 mu g of phosphorus existed over a whole filament, although its distribution was not necessarily uniform. Most of the phosphorus vaporized from the filament during the running test. However, 0.05 to 0.5 mu g of phosphorus remained at the end parts of the filament even after 600 min of running time. The remaining phosphorus is due to the temperature of the end parts of the filament, which is about 1000 deg C lower than that of the central part (about 2500 deg C). In addition, it was confirmed by microautoradiography that phosphorus diffused into the filament at those parts. According to the metallurgical study, reductive non- metallic elements such as phosphorus affect the recrystallization of tungsten crystals by reducing the doping materials. From the microphotographic observation of those parts, it was found that the fiber structure changed completely to the block structure after running, which fact causes the filament to weaken. Further experimental results show that such a structure appears at a temperature higher than 1200 deg C when the filament contacts with phosphorus. It is thus presumed that the weakening phenomenon at the end parts of the filament will be caused by phosphorus remaining at those parts. Therefore, when phosphorus is spread only near the central part of the filament, where the temperature is high enough to vaporize phosphorus rapidly, phosphorus was not found anywhere on the filament after running, and the change of crystal structure was not recognized. (JAIF)
- Research Organization:
- Matsushita Electronics Corp.
- NSA Number:
- NSA-17-030149
- OSTI ID:
- 4690047
- Journal Information:
- Proc. Japan Conf. Radioisotopes, Vol. Vol: 5th, No. 3; Other Information: Orig. Receipt Date: 31-DEC-63
- Country of Publication:
- Country unknown/Code not available
- Language:
- Japanese
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