Microstructures and transport properties: A comparison between grain boundaries artificially produced in YBa{sub 2}Cu{sub 3}O{sub y} bicrystal thin films and bulk crystals
- Argonne National Lab., IL (United States); and others
In order to establish the link between grain boundary (GB) structures and transport properties in superconducting materials, electromagnetic measurements and detailed microstructural studies of carefully prepared GBs are required. Frequently, artifically induced GBs prepared by thin film deposition onto bicrystal substrates are used for such studies. Recently, transmission electron microscopy (TEM) studies have revealed a meandering configuration for GBs in YBa{sub 2}Cu{sub 3}O{sub y} (YBCO) thin film grown on [001] tilt SrTiO{sub 3} bicrystal substrates. The deviation of the meandering GBs away from the underlying substrate GBs varies from a few tens to hundreds of nanometers. We have demonstrated that the magnitude of the meander in terms of amplitude and wavelength can be reduced by lowering the film deposition rate. The meandering GBs were shown to consist of various straight facets which are a few tens to hundreds of nanometers in length. It is possible that the various segments have very different current transport behavior due to a variable misfit dislocation density. Thus, an unambiguous correlation between the microstructure and global transport properties is difficult to attain.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- DOE Contract Number:
- W-31-109-ENG-38
- OSTI ID:
- 468922
- Report Number(s):
- CONF-960877-; TRN: 97:001308-0180
- Resource Relation:
- Conference: Microscopy and microanalysis 1996, Minneapolis, MN (United States), 11-15 Aug 1996; Other Information: PBD: 1996; Related Information: Is Part Of Microscopy and microanalysis 1996; Bailey, G.W.; Corbett, J.M.; Dimlich, R.V.W.; Michael, J.R.; Zaluzec, N.J. [eds.]; PB: 1107 p.
- Country of Publication:
- United States
- Language:
- English
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