TEM/AEM characterization of fine-grained clay minerals in very-low-grade rocks: Evaluation of contamination by EMPA involving celadonite family minerals
- Univ. of Michigan, Ann Arbor, MI (United States)
- Univ. of Otago, Dunedin (New Zealand)
Recent advances in transmission electron microscopy (TEM) and analytical electron microscopy (AEM) have led to many new insights into the structural and chemical characteristics of very fine-grained, optically homogeneous mineral aggregates in sedimentary and very low-grade metamorphic rocks. Chemical compositions obtained by electron microprobe analysis (EMPA) on such materials have been shown by TEM/AEM to result from beam overlap on contaminant phases on a scale below resolution of EMPA, which in turn can lead to errors in interpretation and determination of formation conditions. Here we present an in-depth analysis of the relation between AEM and EMPA data, which leads also to the definition of new mineral phases, and demonstrate the resolution power of AEM relative to EMPA in investigations of very fine-grained mineral aggregates in sedimentary and very low-grade metamorphic rocks.
- OSTI ID:
- 468910
- Report Number(s):
- CONF-960877-; TRN: 97:001308-0167
- Resource Relation:
- Conference: Microscopy and microanalysis 1996, Minneapolis, MN (United States), 11-15 Aug 1996; Other Information: PBD: 1996; Related Information: Is Part Of Microscopy and microanalysis 1996; Bailey, G.W.; Corbett, J.M.; Dimlich, R.V.W.; Michael, J.R.; Zaluzec, N.J. [eds.]; PB: 1107 p.
- Country of Publication:
- United States
- Language:
- English
Similar Records
Microstructure evolution and weathering reactions of Synroc samples crystallized from CaZrTi{sub 2}O{sub 7} melts: TEM/AEM investigation and geochemical modeling
The strain-dependent spatial evolution of garnet in a high- P ductile shear zone from the Western Gneiss Region (Norway): a synchrotron X-ray microtomography study