Quantitative examination of semicrystalline polymers via atomic-force microscopy, transmission electron microscopy, and small-angle X-ray scattering
Conference
·
OSTI ID:468787
- Univ. of Delaware, Newark, DE (United States)
Atomic Force Microscope (AFM) has been used to reliably measure lamellar thickness in semi-crystalline polymers, and to distinguish phases within blends of these polymers. Polyethylene oxide PEO with a molecular weight of 270,000 was determined in three different ways: (1) SAXS spectra, (2) AFM, (3) TEM.
- OSTI ID:
- 468787
- Report Number(s):
- CONF-960877-; TRN: 97:001308-0041
- Resource Relation:
- Conference: Microscopy and microanalysis 1996, Minneapolis, MN (United States), 11-15 Aug 1996; Other Information: PBD: 1996; Related Information: Is Part Of Microscopy and microanalysis 1996; Bailey, G.W.; Corbett, J.M.; Dimlich, R.V.W.; Michael, J.R.; Zaluzec, N.J. [eds.]; PB: 1107 p.
- Country of Publication:
- United States
- Language:
- English
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