Quantitative HREM using non-linear least-squares methods
- Lawrence Livermore National Lab., CA (United States)
Non-linear least-squares methods have been coupled with high resolution image simulation to determine the critical electron microscopic imaging parameters, such as thickness and defocus, from experimental high resolution electron optical images of yttrium aluminum garnet (YAG). For a quantitative fit between experimental and simulated images we seek to minimize the residual image f{sub i}(x) at each pixel, {line_integral}{sub i}(x) = [{integral}{sub i}{sup obs} - {line_integral}{sub i}{sup calc} (x)]/W{sub i}, where {line_integral}{sub i}{sup obs} is the intensity value of the i{sup th} pixel in the experimental image, {line_integral}{sub i}{sup calc} (x) is the intensity value of the i{sup th} pixel in the simulated image based on the image model x, and W is the image that represents the uncertainty associated with measurement of the i{sup th} pixel in the experimental image.
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 468749
- Report Number(s):
- CONF-960877-; TRN: 97:001308-0003
- Resource Relation:
- Conference: Microscopy and microanalysis 1996, Minneapolis, MN (United States), 11-15 Aug 1996; Other Information: PBD: 1996; Related Information: Is Part Of Microscopy and microanalysis 1996; Bailey, G.W.; Corbett, J.M.; Dimlich, R.V.W.; Michael, J.R.; Zaluzec, N.J. [eds.]; PB: 1107 p.
- Country of Publication:
- United States
- Language:
- English
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