DETERMINATION OF ESCAPE DEPTH AND YIELD OF TRULY SECONDARY ELECTRONS FROM EXPERIMENTAL DATA OF X-RAY PHOTOEMISSION ENERGY SPECTRUM

Journal Article · Tue Oct 01 00:00:00 EDT 1963 · Soviet Phys.-Solid State (English Transl.)

OSTI ID:4651258

Shchemelev, V N; Rumsh, M A; Denisov, E P

The thickness of the zone from which truly secondary electrons are emitted (the escape depth) and the yield of the electrons for NaCl, KCl, and KBr, were determined. The determination is based on an analysis of the energy spectrum of x-ray photoemission. (auth)

• Research Organization: Leningrad State Univ.
• NSA Number: NSA-17-039792
• OSTI ID: 4651258
• Journal Information: Soviet Phys.-Solid State (English Transl.), Vol. Vol: 5; Other Information: Orig. Receipt Date: 31-DEC-63
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

PHYSICS
EFFICIENCY
ELECTRONS
EMISSION
ENERGY
MEASURED VALUES
PHOTOPRODUCTION
POTASSIUM BROMIDES
POTASSIUM CHLORIDES
QUANTITATIVE ANALYSIS
SECONDARY EMISSION
SODIUM CHLORIDES
SPECTRA
THICKNESS
X RADIATION