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Title: A SLOW TIME BASE READOUT SYSTEM FOR NON-REPETITIVE PULSE ANALYSIS

Authors:
Publication Date:
Research Org.:
Bendix Corp., Kansas City, Mo.
OSTI Identifier:
4602297
Report Number(s):
BDX-613-71
NSA Number:
NSA-19-030515
DOE Contract Number:
AT(29-1)-613
Resource Type:
Technical Report
Resource Relation:
Other Information: Orig. Receipt Date: 31-DEC-65
Country of Publication:
United States
Language:
English
Subject:
INSTRUMENTATION; Radiation Detection; CIRCUITS; ELECTRIC POTENTIAL; OPERATION; PLANNING; PULSE ANALYZERS; PULSES; RECORDING SYSTEMS; STORAGE

Citation Formats

Thomson, C.E. A SLOW TIME BASE READOUT SYSTEM FOR NON-REPETITIVE PULSE ANALYSIS. United States: N. p., 1965. Web. doi:10.2172/4602297.
Thomson, C.E. A SLOW TIME BASE READOUT SYSTEM FOR NON-REPETITIVE PULSE ANALYSIS. United States. doi:10.2172/4602297.
Thomson, C.E. Sat . "A SLOW TIME BASE READOUT SYSTEM FOR NON-REPETITIVE PULSE ANALYSIS". United States. doi:10.2172/4602297. https://www.osti.gov/servlets/purl/4602297.
@article{osti_4602297,
title = {A SLOW TIME BASE READOUT SYSTEM FOR NON-REPETITIVE PULSE ANALYSIS},
author = {Thomson, C.E.},
abstractNote = {},
doi = {10.2172/4602297},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sat May 01 00:00:00 EDT 1965},
month = {Sat May 01 00:00:00 EDT 1965}
}

Technical Report:

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  • A discussion is given on the development of a system for using electroluminescent indicators for digital display of timing information on motion picture film. It was found that a display, in the form of a matrix of dots, could be contact printed onto color film with an exposure time of 1 msec. (auth)
  • The corabination magnetic-tape and magnetic-core timeof-flight analyzer at Chalk River has a capacity of 16,200 channels, each channel having a word length of 16 binary bits. Part of the readout apparatus for this analyzer includes a punch-card system capable of recording the data in blocks of 900 channels. The majority of data is punched in binary format, requiring 19 cards for 900 channels and taking only 12 seconds to complete. The output cards also contain data from various monitor scalers and experiment switch settings. Following readout the cards can be fed back through the card-punching machine and checked for paritymore » errors. The readout system contains 1300 diodes and 500 transistors, the failure rate for these being 0.15 and 0.27% per annum, respectively, for the first 18 months of operation. (auth)« less
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