VERY BRIGHT FIELD IONIZATION AND FIELD EVAPORATION ION SOURCES. SOME USES. A BEAM FORMATION AND SCANNING SYSTEM.
Technical Report
·
OSTI ID:4581488
- Research Organization:
- Max-Planck-Institut fuer Plasmaphysik, Garching (West Germany)
- NSA Number:
- NSA-27-005381
- OSTI ID:
- 4581488
- Report Number(s):
- IPP-9/6
- Resource Relation:
- Other Information: UNCL. Orig. Receipt Date: 30-JUN-73
- Country of Publication:
- Germany
- Language:
- English
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Related Subjects
N46400* -Instrumentation-Miscellaneous Instruments
APERTURES
BEAM OPTICS
BRIGHTNESS
ELECTROSTATIC LENSES
EVAPORATION
FOCUSING
ION BEAMS
ION MICROSCOPES
ION SOURCES
ION SOURCES/use of bright field and field evaporation
in beam formation and scanning systems
PARTICLE MICROSCOPES/design of scanning ion
using bright field ionization and field evaporation ion sources and electric aperture immersion lens
APERTURES
BEAM OPTICS
BRIGHTNESS
ELECTROSTATIC LENSES
EVAPORATION
FOCUSING
ION BEAMS
ION MICROSCOPES
ION SOURCES
ION SOURCES/use of bright field and field evaporation
in beam formation and scanning systems
PARTICLE MICROSCOPES/design of scanning ion
using bright field ionization and field evaporation ion sources and electric aperture immersion lens