MEASUREMENT OF HIGH-ENERGY $gamma$-RAYS WITH Ge(Li) DETECTORS
Journal Article
·
· Nuclear Instruments and Methods (Netherlands) Formerly Nucl. Instrum. Changed to Nucl. Instrum. Methods Phys. Res.
- Research Organization:
- Michigan State Univ., East Lansing
- NSA Number:
- NSA-20-013095
- OSTI ID:
- 4563620
- Journal Information:
- Nuclear Instruments and Methods (Netherlands) Formerly Nucl. Instrum. Changed to Nucl. Instrum. Methods Phys. Res., Vol. Vol: 39; Other Information: Orig. Receipt Date: 31-DEC-66
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
Similar Records
PRECISE COMPARISON AND MEASUREMENT OF GAMMA-RAY ENERGIES WITH A Ge(Li) DETECTOR. II. 400 TO 1300 keV.
PRECISE COMPARISON AND MEASUREMENT OF GAMMA-RAY ENERGIES WITH A Ge(Li) DETECTOR. I. 50 TO 420 keV.
SIMPLE AND ACCURATE CALIBRATION TECHNIQUE FOR MEASURING $gamma$-RAY ENERGIES AND Ge(Li) DETECTOR LINEARITY.
Journal Article
·
Fri Jan 01 00:00:00 EST 1971
· Nucl. Instrum. Methods 96: No. 1, 173-96(1971).
·
OSTI ID:4563620
PRECISE COMPARISON AND MEASUREMENT OF GAMMA-RAY ENERGIES WITH A Ge(Li) DETECTOR. I. 50 TO 420 keV.
Journal Article
·
Thu Jan 01 00:00:00 EST 1970
· Nucl. Instrum. Methods 77: 141-58(1970).
·
OSTI ID:4563620
SIMPLE AND ACCURATE CALIBRATION TECHNIQUE FOR MEASURING $gamma$-RAY ENERGIES AND Ge(Li) DETECTOR LINEARITY.
Journal Article
·
Wed Jan 01 00:00:00 EST 1969
· Nucl. Instrum. Methods 76: 285-94(1969).
·
OSTI ID:4563620
Related Subjects
INSTRUMENTATION
Radiation Detection
CAPACITORS
CIRCUITS
CONFIGURATION
CRYSTAL COUNTERS
DETECTION
DIAGRAMS
DIFFUSION
EFFICIENCY
ENERGY
ENERGY LEVELS
ENERGY RANGE
ERRORS
GAMMA RADIATION
GERMANIUM
KEV RANGE
LAYERS
LITHIUM
MEASURED VALUES
MEV RANGE
OXYGEN 16
PERFORMANCE
SEMICONDUCTORS
STANDARDS
SURFACES
TABLES
TRACE AMOUNTS
TRANSIENTS
Radiation Detection
CAPACITORS
CIRCUITS
CONFIGURATION
CRYSTAL COUNTERS
DETECTION
DIAGRAMS
DIFFUSION
EFFICIENCY
ENERGY
ENERGY LEVELS
ENERGY RANGE
ERRORS
GAMMA RADIATION
GERMANIUM
KEV RANGE
LAYERS
LITHIUM
MEASURED VALUES
MEV RANGE
OXYGEN 16
PERFORMANCE
SEMICONDUCTORS
STANDARDS
SURFACES
TABLES
TRACE AMOUNTS
TRANSIENTS