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Title: Thomson scattering measurements in the RFX reversed field pinch

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1147762· OSTI ID:451860
; ; ; ;  [1]
  1. Gruppo di Padova per Ricerche sulla Fusione, Associazione EURATOM ENEA CNR, Universita di Padova, Padova (Italy)

The first systematic measurements of the electron temperature (T{sub e}) spatial profile have been obtained in the reversed field pinch experiment RFX with a single pulse Thomson scattering (TS) diagnostic. Scattered light from a ruby laser pulse (E{le}15 J, {Delta}t=30 ns) is collected through three objectives from 10 positions along a diameter in the plasma equatorial plane, with a spatial resolution of 2.5 cm. Plasma discharges with current in the range 700{endash}900 kA have been investigated finding evidence of a quite flat T{sub e} profile. Data dispersion significantly greater than experimental uncertainties provides an indication of remarkable plasma fluctuations. Results are in good agreement with T{sub e} measurements from other single chord spectroscopic diagnostics (SiLi detector and SXR double filter), showing a reliable operation down to an electron density n{sub e}=3{times}10{sup 19} m{sup {minus}3}. Integration of this apparatus with a ND:YLF laser system for multipulse Thomson scattering measurements, sharing the same input optics, is under way. {copyright} {ital 1997 American Institute of Physics.}

OSTI ID:
451860
Report Number(s):
CONF-960543-; ISSN 0034-6748; TRN: 97:006219
Journal Information:
Review of Scientific Instruments, Vol. 68, Issue 1; Conference: 11. annual high-temperature plasma diagnostics conference, Monterey, CA (United States), 12-16 May 1996; Other Information: PBD: Jan 1997
Country of Publication:
United States
Language:
English

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