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Title: A systems-oriented single event effects test approach for high speed digital phase-locked loops

Abstract

A systems-oriented single event effects (SEE) test approach is outlined here for two different phase-locked loop (PLL) application specific integrated circuits (ASICs) used for spaceborne local oscillator (LO) generation. The system considerations in designing the upset detection technique is described. This is the only known technique for getting information critical to the system about single event upset (SEU) sensitivity at speed for PLLs. Test results are presented for PLL devices operating at clock speeds of 1.0 and 1.5 GHz. Significant frequency effects were not observed in these devices since the clock speed varied only 50%.

Authors:
;  [1];  [2]
  1. Hughes Space and Communications, Los Angeles, CA (United States)
  2. Aerospace Corp., Los Angeles, CA (United States)
Publication Date:
OSTI Identifier:
445452
Report Number(s):
CONF-960773-
Journal ID: IETNAE; ISSN 0018-9499; TRN: 97:005137
Resource Type:
Journal Article
Journal Name:
IEEE Transactions on Nuclear Science
Additional Journal Information:
Journal Volume: 43; Journal Issue: 6Pt1; Conference: Institute of Electrical and Electronics Engineers/Nuclear and Space Radiation Effects conference (NSREC `96), Indian Wells, CA (United States), 15-19 Jul 1996; Other Information: PBD: Dec 1996
Country of Publication:
United States
Language:
English
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; PHYSICAL RADIATION EFFECTS; INTEGRATED CIRCUITS; DIGITAL SYSTEMS; TESTING; SPACE FLIGHT

Citation Formats

Jobe, K, Shoga, M, and Koga, R. A systems-oriented single event effects test approach for high speed digital phase-locked loops. United States: N. p., 1996. Web. doi:10.1109/23.556879.
Jobe, K, Shoga, M, & Koga, R. A systems-oriented single event effects test approach for high speed digital phase-locked loops. United States. https://doi.org/10.1109/23.556879
Jobe, K, Shoga, M, and Koga, R. 1996. "A systems-oriented single event effects test approach for high speed digital phase-locked loops". United States. https://doi.org/10.1109/23.556879.
@article{osti_445452,
title = {A systems-oriented single event effects test approach for high speed digital phase-locked loops},
author = {Jobe, K and Shoga, M and Koga, R},
abstractNote = {A systems-oriented single event effects (SEE) test approach is outlined here for two different phase-locked loop (PLL) application specific integrated circuits (ASICs) used for spaceborne local oscillator (LO) generation. The system considerations in designing the upset detection technique is described. This is the only known technique for getting information critical to the system about single event upset (SEU) sensitivity at speed for PLLs. Test results are presented for PLL devices operating at clock speeds of 1.0 and 1.5 GHz. Significant frequency effects were not observed in these devices since the clock speed varied only 50%.},
doi = {10.1109/23.556879},
url = {https://www.osti.gov/biblio/445452}, journal = {IEEE Transactions on Nuclear Science},
number = 6Pt1,
volume = 43,
place = {United States},
year = {1996},
month = {12}
}