Femtosecond X-ray pulses at 0.4 {angstrom} generated by 90{degrees} Thomson scattering: A tool for probing the structural dynamics of materials

Journal Article · Fri Oct 11 00:00:00 EDT 1996 · Science

DOI:https://doi.org/10.1126/science.274.5285.236· OSTI ID:443390

Schoenlein, R W; Glover, T E; Balling, P ^[1]

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1. Lawrence Berkeley National Lab., CA (United States); and others

Pulses of X-rays 300 femtoseconds in duration at a wavelength of 0.4 angstrom (30,000 electron volts) have been generated by 90{degrees} Thomson scattering between infrared terawatt laser pulses and highly relativistic electrons from an accelerator. In the right-angle scattering geometry, the duration of the x-ray burst is determined by the transit time of the laser pulse across the {approximately} 90-micrometer waist of the focused electron beam. The x-rays are highly directed ({approximately}0.6{degrees} divergence) and can be tuned in energy. This source of femtosecond x-rays will make it possible to combine x-ray techniques with ultrafast time resolution to investigate structural dynamics on condensed matter. 23 refs., 3 tabs.

• OSTI ID: 443390
• Journal Information: Science, Vol. 274, Issue 5285; Other Information: PBD: 11 Oct 1996
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
X RADIATION
PULSES
MATERIALS
CRYSTAL STRUCTURE
EVALUATION
THOMSON SCATTERING
TIME RESOLUTION