Magnetic properties and microstructure studies of Sm{endash}Fe magnetic thin films
- Fundamental Research Department, Corporate Research and Development Laboratories, Sumitomo Metal Industries, Ltd., 1-8 Fusocho, Amagasaki (Japan)
- Sumitomo Special Metals Co., Ltd., Egawa, Osaka (Japan)
Binary Sm{sub x}Fe{sub 100{minus}x}(2{lt}x{lt}12) thin films were made by rf sputtering of the target onto preheated quartz glass substrates. Structural characterization, magnetic measurement, and microstructure observation were carried out by x-ray diffractometer, vibrating sample magnetometer, scanning electron microscope, and transmission electron microscope (TEM), respectively. Directly crystallized films were synthesized at substrate temperature higher than 400{degree}C and the main phase of the films is the ThMn{sub 12}-type tetragonal phase with lattice parameters a=8.65 {Angstrom} and c=4.78 {Angstrom}. Films have the predominant [111] and [001] crystallographic texture when the substrate temperature is lower and higher than 600{degree}C, respectively. The perpendicular magnetization measured under the applied field of 22 kOe is about 30{percent} higher than the saturation magnetization of bulk SmFe{sub 11}Ti. Coercivities of about 4.0 kOe can be obtained in the substrate temperature range between 430 and 550{degree}C with grain size of 0.2{endash}0.3 {mu}m. Cross-sectional TEM microstructure observations show significant columnar structures in the films. The [001] texture formed in the films is also clearly reflected by the planar and cross-sectional TEM diffraction patterns. {copyright} {ital 1997 American Institute of Physics.}
- OSTI ID:
- 435107
- Journal Information:
- Journal of Applied Physics, Vol. 81, Issue 1; Other Information: PBD: Jan 1997
- Country of Publication:
- United States
- Language:
- English
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