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Title: INFLUENCE OF SURFACE ACTIVE AGENTS ON ThO$sub 2$ SLURRIES

Technical Report ·
DOI:https://doi.org/10.2172/4334374· OSTI ID:4334374

An analysis, based on electrical double-layer concepts, of the influence of surface active agents on ThO/sub 2/ slurry properties indicates that under reactor conditions the use of additives to obtain certain slurry properties such as low yield stress will not be effective. Corrosion ions, fission ions, and ions resulting from radiation will compress the electrical double layer on the particle surface and reduce its dispersing effect. Elevated temperatures will also work against effective double layer properties, primarily through effect on the dielectric constant. Colloidal suspensions under conditions encountered in a reactor are unstable and accordingly stable slurry properties dependent on the surface condition are unlikely to exist. Similar arguments suggest that ceramic or other surface coatings on ThO/sub 2/ particles probably would not strongly influence slurry properties in a reactor. Evidence, ss yet inconclusive, suggests that electrolyte additives, which prevent cake formation in slurries where it otherwise would be expected, act through influence on the rate and nature of primary particle degradation. (auth)

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
DOE Contract Number:
W-7405-ENG-26
NSA Number:
NSA-12-012973
OSTI ID:
4334374
Report Number(s):
CF-58-7-56
Resource Relation:
Other Information: Orig. Receipt Date: 31-DEC-58
Country of Publication:
United States
Language:
English