High-sensitivity ESCA instrument

Conference · Mon Jan 01 00:00:00 EST 1973 · Advan. X-Ray Anal., v. 16, pp. 90-101

OSTI ID:4308123

Davies, R D; Herglotz, H K; Lee, J D; Suchan, H L

A new electron spectroscopy for chemical analysis (ESCA) instrument has been developed to provide high sensitivity and efficient operation for laboratory analysis of composition and chemical bonding in very thin surface layers of solid samples. High sensitivity is achieved by means of the high-intensity, efficient x-ray source described by Davies and Herglotz at the 1968 Denver X-Ray Conference, in combination with the new electron energy analyzer described by Lee at the 1972 Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy. A sample chamber designed to provide for rapid introduction and replacement of samples has adequate facilities for various sample treatments and conditiouing followed immediately by ESCA analysis of the sample. Examples of application are presented, demonstrating the sensitivity and resolution achievable with this instrument. Its usefulness in trace surface analysis is shown and some chemical shifts'' measured by the instrument are compared with those obtained by x-ray spectroscopy. (auth)

• Research Organization: E. I. du Pont de Nemours and Co. Inc., Wilmington, DE
• NSA Number: NSA-29-024374
• OSTI ID: 4308123
• Journal Information: Advan. X-Ray Anal., v. 16, pp. 90-101, Conference: Applications of x-ray analysis conference, Denver, Colorado, USA, 2 Aug 1972; Other Information: See CONF-720801--. Orig. Receipt Date: 30-JUN-74
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

N46400* -Instrumentation-Miscellaneous Instruments
N40130 -Chemistry-Analytical & Separations Chemistry-Radiometric & Radiochemical Procedures
*CHEMICAL ANALYSIS- PHOTOELECTRON SPECTROSCOPY
*PHOTOELECTRON SPECTROSCOPY
*SURFACES- CHEMICAL ANALYSIS
ELECTRON SPECTROMETERS
OPERATION
PERFORMANCE
X-RAY SOURCES