Traveling ionization disturbance during microwave breakdown of argon
Journal Article
·
· J. Appl. Phys., v. 45, no. 12, pp. 5257-5259
- Research Organization:
- Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, Massachusetts 01002
- Sponsoring Organization:
- USDOE
- NSA Number:
- NSA-31-003207
- OSTI ID:
- 4267677
- Journal Information:
- J. Appl. Phys., v. 45, no. 12, pp. 5257-5259, Other Information: Orig. Receipt Date: 30-JUN-75
- Country of Publication:
- United States
- Language:
- English
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