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Title: Use of fluxoid quantization in the measurement of the inductance of single- junction SQUIDs

Authors:
;
Publication Date:
Research Org.:
Department of Physics, State University of New York, Stony Brook, New York 11794
Sponsoring Org.:
USDOE
OSTI Identifier:
4244512
NSA Number:
NSA-32-003412
Resource Type:
Journal Article
Journal Name:
J. Appl. Phys., v. 46, no. 5, pp. 2257-2260
Additional Journal Information:
Other Information: Orig. Receipt Date: 31-DEC-75
Country of Publication:
United States
Language:
English
Subject:
N42220* -Engineering-Facilities & Equipment-Cryogenic & Superconducting Equipment & Devices; *SQUID DEVICES- FLUX QUANTIZATION; CRITICAL CURRENT; FILMS; JOSEPHSON JUNCTIONS; MAGNETIC FLUX; MAGNETOMETERS; NIOBIUM; ORDER PARAMETERS; RINGS; SUPERCONDUCTING JUNCTIONS; SUPERCONDUCTIVITY; VARIATIONS

Citation Formats

Pei, S S, and Lukens, J E. Use of fluxoid quantization in the measurement of the inductance of single- junction SQUIDs. United States: N. p., 1975. Web. doi:10.1063/1.321818.
Pei, S S, & Lukens, J E. Use of fluxoid quantization in the measurement of the inductance of single- junction SQUIDs. United States. https://doi.org/10.1063/1.321818
Pei, S S, and Lukens, J E. 1975. "Use of fluxoid quantization in the measurement of the inductance of single- junction SQUIDs". United States. https://doi.org/10.1063/1.321818.
@article{osti_4244512,
title = {Use of fluxoid quantization in the measurement of the inductance of single- junction SQUIDs},
author = {Pei, S S and Lukens, J E},
abstractNote = {},
doi = {10.1063/1.321818},
url = {https://www.osti.gov/biblio/4244512}, journal = {J. Appl. Phys., v. 46, no. 5, pp. 2257-2260},
number = ,
volume = ,
place = {United States},
year = {Thu May 01 00:00:00 EDT 1975},
month = {Thu May 01 00:00:00 EDT 1975}
}