Thermal emission, electrical conductivity, and hall effect for defects study at high temperature (T greater than or equal to 1250$sup 0$K) in refractory oxides (Y$sub 2$$O$$sub 3$, TiO$sub 2$)
Journal Article
·
· J. Solid State Chem., v. 12, no. 3-4, pp. 324-328
OSTI ID:4239975
- Research Organization:
- CNRS, Orleans, France
- NSA Number:
- NSA-31-020211
- OSTI ID:
- 4239975
- Journal Information:
- J. Solid State Chem., v. 12, no. 3-4, pp. 324-328, Other Information: Orig. Receipt Date: 30-JUN-75
- Country of Publication:
- United States
- Language:
- English
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