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Title: BEAM CONTROL PROBE

Abstract

A probe is described for intercepting a desired portion of a beam of charged particles and for indicating the spatial disposition of the beam. The disclosed probe assembly includes a pair of pivotally mounted vanes moveable into a single plane with adjacent edges joining and a calibrated mechanical arrangement for pivoting the vancs apart. When the probe is disposed in the path of a charged particle beam, the vanes may be adjusted according to the beam current received in each vane to ascertain the dimension of the beam.

Inventors:
Publication Date:
Research Org.:
Originating Research Org. not identified
OSTI Identifier:
4239933
Patent Number(s):
US 2878287
Assignee:
U.S. Atomic Energy Commission
NSA Number:
NSA-13-015334
Resource Type:
Patent
Resource Relation:
Other Information: Orig. Receipt Date: 31-DEC-59
Country of Publication:
United States
Language:
English
Subject:
INSTRUMENTS; BEAMS; CHARGED PARTICLES; CONFIGURATION; CONTROL SYSTEMS; FINS; MECHANICS; STANDARDS

Citation Formats

Chesterman, A W. BEAM CONTROL PROBE. United States: N. p., 1959. Web.
Chesterman, A W. BEAM CONTROL PROBE. United States.
Chesterman, A W. 1959. "BEAM CONTROL PROBE". United States.
@article{osti_4239933,
title = {BEAM CONTROL PROBE},
author = {Chesterman, A W},
abstractNote = {A probe is described for intercepting a desired portion of a beam of charged particles and for indicating the spatial disposition of the beam. The disclosed probe assembly includes a pair of pivotally mounted vanes moveable into a single plane with adjacent edges joining and a calibrated mechanical arrangement for pivoting the vancs apart. When the probe is disposed in the path of a charged particle beam, the vanes may be adjusted according to the beam current received in each vane to ascertain the dimension of the beam.},
doi = {},
url = {https://www.osti.gov/biblio/4239933}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Mar 17 00:00:00 EST 1959},
month = {Tue Mar 17 00:00:00 EST 1959}
}