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Title: Boundary element simulation of electron trajectories for a field emitter

Conference ·
OSTI ID:423037
; ; ;  [1]
  1. Naval Research Lab., Washington, DC (United States). Electronic Science and Technology Div.

The details of the electron emission from field emitter array structures and trajectories into the acceleration region of the gun structure are required for the design of proposed next generation Inductive Output Amplifiers (IOA`s). A model that corresponds well to the actual geometry of the gated field emitter is expected to provide a more accurate comparison with the experimentally measured quantities. The axially symmetric unit cell model selected consists of an anode, a gate with hole, and a base plane with a vertical emitter trip protruding. The small sizes characteristic of the apex of the emitter tips in comparison to the size and distances of the other electrodes suggest the use of a nonuniform discretization of the computational domain. The use of typical finite-difference formulations with uniform mesh is therefore contraindicated. A variable-mesh finite-difference or finite-element technique could be used. However, because of the sensitivity of the emission upon the local geometry in the small region near the emitter tip, a boundary-element model was chosen. The trajectories of the beam are followed from the emitting surface to the surface to be taken as the initial location for the beam to enter the acceleration region of the gun geometry. The purpose of this is to provide information concerning gate interception, beam uniformity, velocity distribution, for initialization of a larger scale gun and device design.

Sponsoring Organization:
Office of Naval Research, Washington, DC (United States)
OSTI ID:
423037
Report Number(s):
CONF-960634-; TRN: IM9707%%344
Resource Relation:
Conference: 1996 IEEE international conference on plasma science, Boston, MA (United States), 3-5 Jun 1996; Other Information: PBD: 1996; Related Information: Is Part Of IEEE conference record -- Abstracts: 1996 IEEE international conference on plasma science; PB: 324 p.
Country of Publication:
United States
Language:
English

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