skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: ELECTRON MICROSCOPICAL EXAMINATION OF BONDS IN ZIRCALOY-2

Abstract

Electron microscopy was used to supplement metallographic studies of bonds between Zircaloy-2 interfaces. Treated surfaces before bonding, and bonded sections made by a variety of techniques were examined. Electron micrographs of belt-abraded surfaces exhibited a consistent fine-scale roughness. Chemically pickled surfaces were nearly smooth regardless of prior treatment. Chemically pickled samples and a zirconium oxide-coated sample pressure bonded at 1500 F and 10,000 psi had pitting at bond lines that could have been due to voids or to contaminant at the interface which etchod out. The pitting was almost completely eliminated in one sample by pressing one hour at 500 F and 350,000 psi. This indicated that the bond-line pitting in these samples was due to voids at the interface. Zircaloy-2 samples pressure bonded after coating with carbon chromium, iron nickel, or tin etched in relief along the bond line, indicating the presence of contaminant at the interface. On the basis of the present investigation, it is proposed that grain growth across the interface in chemically pickled samples may have been inhibited by the presence of a thin contaminant film originally present on the Zircaloy surfaces. However, the poor grain-growth characteristics of chemically pickled samples may also be due inmore » part to the surfaces being too smooth. (auth)« less

Authors:
;
Publication Date:
Research Org.:
Battelle Memorial Inst., Columbus, Ohio
OSTI Identifier:
4212487
Report Number(s):
BMI-1364
NSA Number:
NSA-13-019223
DOE Contract Number:  
W-7405-ENG-92; NOBS-65057
Resource Type:
Technical Report
Resource Relation:
Other Information: Orig. Receipt Date: 31-DEC-59
Country of Publication:
United States
Language:
English
Subject:
METALLURGY AND CERAMICS; BONDING; CARBON; CHROMIUM; COATING; CONFIGURATION; ELECTRON MICROSCOPY; ETCHING; FILMS; GRAIN SIZE; IRON; METALLOGRAPHY; NICKEL; SURFACES; TIN; ZIRCALOY; ZIRCONIUM OXIDES

Citation Formats

Young, A.P., and Schwartz, C.M. ELECTRON MICROSCOPICAL EXAMINATION OF BONDS IN ZIRCALOY-2. United States: N. p., 1959. Web. doi:10.2172/4212487.
Young, A.P., & Schwartz, C.M. ELECTRON MICROSCOPICAL EXAMINATION OF BONDS IN ZIRCALOY-2. United States. doi:10.2172/4212487.
Young, A.P., and Schwartz, C.M. Wed . "ELECTRON MICROSCOPICAL EXAMINATION OF BONDS IN ZIRCALOY-2". United States. doi:10.2172/4212487. https://www.osti.gov/servlets/purl/4212487.
@article{osti_4212487,
title = {ELECTRON MICROSCOPICAL EXAMINATION OF BONDS IN ZIRCALOY-2},
author = {Young, A.P. and Schwartz, C.M.},
abstractNote = {Electron microscopy was used to supplement metallographic studies of bonds between Zircaloy-2 interfaces. Treated surfaces before bonding, and bonded sections made by a variety of techniques were examined. Electron micrographs of belt-abraded surfaces exhibited a consistent fine-scale roughness. Chemically pickled surfaces were nearly smooth regardless of prior treatment. Chemically pickled samples and a zirconium oxide-coated sample pressure bonded at 1500 F and 10,000 psi had pitting at bond lines that could have been due to voids or to contaminant at the interface which etchod out. The pitting was almost completely eliminated in one sample by pressing one hour at 500 F and 350,000 psi. This indicated that the bond-line pitting in these samples was due to voids at the interface. Zircaloy-2 samples pressure bonded after coating with carbon chromium, iron nickel, or tin etched in relief along the bond line, indicating the presence of contaminant at the interface. On the basis of the present investigation, it is proposed that grain growth across the interface in chemically pickled samples may have been inhibited by the presence of a thin contaminant film originally present on the Zircaloy surfaces. However, the poor grain-growth characteristics of chemically pickled samples may also be due in part to the surfaces being too smooth. (auth)},
doi = {10.2172/4212487},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1959},
month = {7}
}