ADAPTATION OF AN X-RAY DIFFRACTOMETER FOR THIN FILM STUDIES BY TOTAL REFLECTION OF X RAYS

Journal Article · Wed Jan 01 00:00:00 EST 1964 · Rev. Sci. Instr.

DOI:https://doi.org/10.1063/1.1718712· OSTI ID:4128891

Mozzi, R L; Guentert, O J

In studying solid surfaces by the total reflection of x rays it is important to use monochromatic radiation with a narrow angular divergence and to employ a mechanism for precisely aligning the surface of the sample relative to the incident beam. An x-ray monochromator, based on the phenomenon of anomalous transmission in nearly perfect germanium crystals, and a sample holder are described that convert a conventional x-ray diffractometer to an Procedures for alignment and operation of the reflectometer and a sample measurement of the thickness and density of a thin titanium film are presented. (auth)

• Research Organization: Raytheon Co., Waltham, Mass.
• Sponsoring Organization: USDOE
• NSA Number: NSA-18-008624
• OSTI ID: 4128891
• Journal Information: Rev. Sci. Instr., Vol. Vol: 35; Other Information: Orig. Receipt Date: 31-DEC-64
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

INSTRUMENTATION
ANGULAR DISTRIBUTION
CRYSTALS
DENSITY
DIFFRACTION
FILMS
GAMMA SPECTROMETERS
GERMANIUM
MONOCHROMATORS
OPERATION
REFLECTION
SOLIDS
SPECTROMETERS
SURFACES
THICKNESS
TITANIUM
X RADIATION