TECHNICAL PROGRESS REPORT. PART I. HIGH-SPEED COMPUTER PROGRAM. PART II. ILLIAC II SYSTEM PROGRAMMING AND OPERATION. PART III. CIRCUIT RESEARCH PROGRAM. PART IV. MATHEMATICAL METHODS. PART V. IBM 7090-1401 SYSTEM. PART VI. GENERAL LABORATORY INFORMATION
Upper and lower bounds were established for the impedance of a generalized strip line. An attempt was also made to solve the tunnel diode-- transistor interface problem by using a two-transistor negative input impedance circuit, the impedance behavior of which approached that of a tunnel diode. Additionally, initial observations were made on the breakdown characteristics of a microplasma diode. Corrections were made to the Wiener integral evaluation programs FI-17 and FI-21, and five routines were added to the IBM 7094-1401 system. Thirty-nine problem specifications (described), seven of them instructional, were submitted to the IBM 7094. Operation and reliability of the IBM 1401 and 7094 and the ILLIAC II system are summarized, together with ILLIAC II programing and component development and testing in the high-speed computer program. (D.C.W.)
- Research Organization:
- Illinois. Univ., Urbana. Digital Computer Lab.
- DOE Contract Number:
- AT(11-1)-415
- NSA Number:
- NSA-18-014351
- OSTI ID:
- 4084357
- Report Number(s):
- TID-20258
- Resource Relation:
- Other Information: Orig. Receipt Date: 31-DEC-64
- Country of Publication:
- United States
- Language:
- English
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TECHNICAL PROGRESS REPORT. PART I. HIGH-SPEED COMPUTER PROGRAM. PART II. ILLIAC II SYSTEM PROGRAMMING AND OPERATING. PART III. CIRCUIT RESEARCH PROGRAM. PART IV. MATHEMATICS. PART V. IBM 7090-1401 SYSTEM. PART VI. GENERAL LABORATORY INFORMATION
TECHNICAL PROGRESS REPORT. PART I. HIGH-SPEED COMPUTER PROGRAM. PART II. ILLIAC II SYSTEMS PROGRAMMING AND OPERATION. PART III. CIRCUIT RESEARCH PROGRAM. PART IV. MATHEMATICAL METHODS. PART V. DATA REDUCTION METHODS. PART VI. IBM 7090-1401 SYSTEM. PART VII. GENERAL LABORATORY INFORMATION