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Title: Collective emission degradation behavior of carbon nanotube thin-film electron emitters

Abstract

The current-induced emission degradation of a carbon nanotube (CNT) thin-film electron emitter is studied under constant emission current for different current levels, using a scanning anode field emission microscope. A permanent emission degradation is observed for emission currents higher than 300 nA per CNT and is associated with resistive heating at the CNT--substrate interface for the sample under investigation. A second field-induced emission degradation mechanism, associated with the removal of CNTs from the substrate, is also reported. {copyright} 2001 American Institute of Physics.

Authors:
; ; ;
Publication Date:
Sponsoring Org.:
(US)
OSTI Identifier:
40230786
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 79; Journal Issue: 7; Other Information: DOI: 10.1063/1.1392982; Othernumber: APPLAB000079000007001036000001; 024133APL; PBD: 13 Aug 2001; Journal ID: ISSN 0003-6951
Publisher:
The American Physical Society
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ANODES; CARBON; ELECTRONS; FIELD EMISSION; HEATING; PHYSICS; REMOVAL

Citation Formats

Nilsson, L, Groening, O, Groening, P, and Schlapbach, L. Collective emission degradation behavior of carbon nanotube thin-film electron emitters. United States: N. p., 2001. Web. doi:10.1063/1.1392982.
Nilsson, L, Groening, O, Groening, P, & Schlapbach, L. Collective emission degradation behavior of carbon nanotube thin-film electron emitters. United States. doi:10.1063/1.1392982.
Nilsson, L, Groening, O, Groening, P, and Schlapbach, L. Mon . "Collective emission degradation behavior of carbon nanotube thin-film electron emitters". United States. doi:10.1063/1.1392982.
@article{osti_40230786,
title = {Collective emission degradation behavior of carbon nanotube thin-film electron emitters},
author = {Nilsson, L and Groening, O and Groening, P and Schlapbach, L},
abstractNote = {The current-induced emission degradation of a carbon nanotube (CNT) thin-film electron emitter is studied under constant emission current for different current levels, using a scanning anode field emission microscope. A permanent emission degradation is observed for emission currents higher than 300 nA per CNT and is associated with resistive heating at the CNT--substrate interface for the sample under investigation. A second field-induced emission degradation mechanism, associated with the removal of CNTs from the substrate, is also reported. {copyright} 2001 American Institute of Physics.},
doi = {10.1063/1.1392982},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 7,
volume = 79,
place = {United States},
year = {2001},
month = {8}
}