Dichroic Bragg reflectors based on birefringent porous silicon
Multilayers of anisotropically nanostructured silicon (Si) have been fabricated and studied by polarization-resolved reflection measurements. Alternating layers having different refractive indices exhibit additionally a strong in-plane anisotropy of their refractive index (birefringence). Therefore, a stack of layers, acting as a distributed Bragg reflector, has two distinct reflection bands, depending on the polarization of the incident linearly polarized light. This effect is governed by a three-dimensional (in-plane and in-depth) variation of the refractive index. These structures can yield optical effects which are difficult to achieve with conventional Bragg reflectors. {copyright} 2001 American Institute of Physics.
- Sponsoring Organization:
- (US)
- OSTI ID:
- 40204316
- Journal Information:
- Applied Physics Letters, Vol. 78, Issue 24; Other Information: DOI: 10.1063/1.1378045; Othernumber: APPLAB000078000024003887000001; 045123APL; PBD: 11 Jun 2001; ISSN 0003-6951
- Publisher:
- The American Physical Society
- Country of Publication:
- United States
- Language:
- English
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