Reflection-mode scattering-type scanning near-field optical microscope using a laser trapped gold colloidal particle as a scattering probe

Journal Article · Fri Jun 01 00:00:00 EDT 2001 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.1331070· OSTI ID:40203786

Konada, Takeshi; Sasaki, Hiroko; Yamaguchi, Mitsushiro; Suzuki, Yoshimasa; Sasaki, Yasuo

We have developed a reflection-mode scattering-type scanning near-field optical microscope using a laser trapped gold colloidal particle as a scattering probe and succeeded in observing the reflectance change of an opaque semiconductor sample with the alternating layers of GaAs and Al{sub 0.55}Ga{sub 0.45}As. The spatial resolution became as high as 200 nm when using a 200 nm gold colloidal particle. The results indicated that the resolution obtained in the experiment is in good agreement with the trapped particle size and overcame the diffraction limit (420 nm) of the lens system. {copyright} 2001 American Institute of Physics.

• Sponsoring Organization: (US)
• OSTI ID: 40203786
• Journal Information: Journal of Applied Physics, Vol. 89, Issue 11; Other Information: DOI: 10.1063/1.1331070; Othernumber: JAPIAU000089000011006481000001; 048102JAP; PBD: 1 Jun 2001; ISSN 0021-8979
• Publisher: The American Physical Society
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
DIFFRACTION
GOLD
LASERS
OPTICAL MICROSCOPES
PARTICLE SIZE
PHYSICS
PROBES
RESOLUTION
SCATTERING
SPATIAL RESOLUTION