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Title: Harmonic and power balance tools for tapping-mode atomic force microscope

Abstract

The atomic force microscope (AFM) is a powerful tool for investigating surfaces at atomic scales. Harmonic balance and power balance techniques are introduced to analyze the tapping-mode dynamics of the atomic force microscope. The harmonic balance perspective explains observations hitherto unexplained in the AFM literature. A nonconservative model for the cantilever{endash}sample interaction is developed. The energy dissipation in the sample is studied and the resulting power balance equations combined with the harmonic balance equations are used to estimate the model parameters. Experimental results confirm that the harmonic and power balance tools can be used effectively to predict the behavior of the tapping cantilever. {copyright} 2001 American Institute of Physics.

Authors:
; ; ;
Publication Date:
Sponsoring Org.:
(US)
OSTI Identifier:
40203785
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 89; Journal Issue: 11; Other Information: DOI: 10.1063/1.1365440; Othernumber: JAPIAU000089000011006473000001; 074110JAP; PBD: 1 Jun 2001; Journal ID: ISSN 0021-8979
Publisher:
The American Physical Society
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ENERGY LOSSES; HARMONICS; MICROSCOPES; PHYSICS

Citation Formats

Sebastian, A, Salapaka, M V, Chen, D J, and Cleveland, J P. Harmonic and power balance tools for tapping-mode atomic force microscope. United States: N. p., 2001. Web. doi:10.1063/1.1365440.
Sebastian, A, Salapaka, M V, Chen, D J, & Cleveland, J P. Harmonic and power balance tools for tapping-mode atomic force microscope. United States. https://doi.org/10.1063/1.1365440
Sebastian, A, Salapaka, M V, Chen, D J, and Cleveland, J P. 2001. "Harmonic and power balance tools for tapping-mode atomic force microscope". United States. https://doi.org/10.1063/1.1365440.
@article{osti_40203785,
title = {Harmonic and power balance tools for tapping-mode atomic force microscope},
author = {Sebastian, A and Salapaka, M V and Chen, D J and Cleveland, J P},
abstractNote = {The atomic force microscope (AFM) is a powerful tool for investigating surfaces at atomic scales. Harmonic balance and power balance techniques are introduced to analyze the tapping-mode dynamics of the atomic force microscope. The harmonic balance perspective explains observations hitherto unexplained in the AFM literature. A nonconservative model for the cantilever{endash}sample interaction is developed. The energy dissipation in the sample is studied and the resulting power balance equations combined with the harmonic balance equations are used to estimate the model parameters. Experimental results confirm that the harmonic and power balance tools can be used effectively to predict the behavior of the tapping cantilever. {copyright} 2001 American Institute of Physics.},
doi = {10.1063/1.1365440},
url = {https://www.osti.gov/biblio/40203785}, journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 11,
volume = 89,
place = {United States},
year = {Fri Jun 01 00:00:00 EDT 2001},
month = {Fri Jun 01 00:00:00 EDT 2001}
}